something about STDF

2018/08/09 08:56
阅读数 152

A tips for STDF here for reference.

Some notes for STDF while do STDF data parsing....

stdf is a binary file type, so we need a tool to read it or convert to text-based file then can view the content.

you can google stdf tool then can get some useful information...

STDF SPEC(V4)

STDF_V4 http://freefr.dl.sourceforge.net/project/freestdf/docs/STDF-v4-spec.pdf

ATDF file structure

  • note, it's converted thorough stdf2atdf, and atdf is a text format. that will help us to understand the file structure.
    • Far:2|4 File Attributes Record: CPU_TYPE| STDF_VER, first line to indicate stdf version
    • Atr:1466398194|dataformatter tester config; Ver: SmarTest s/w rev. 7.1.4.6 (E), 05-Feb-13; dataformatter 2.0.12 Feb 5 2013 11:55:26 Audit Trail Record:
    • Mir:12:48:19 20-Jun-2016|12:49:54 20-Jun-2016|1| |N| |65535| |0||suz93k15|93000-SOC|SAMOA_S3PRO_A0F1P_250revH|||demo|93000|s/w rev. 7.1.4.6
      • SETUP_T| START_T| STAT_NUM| MODE_COD| RTST_COD| PROT_COD| BURN_TIM| CMOD_COD| LOT_ID| PART_TYP|NODE_NAM|TSTR_TYP|…SBLOT_ID|OPER_NAM
    • Sdr:1|2|2|1,2||||||||||||||||
      • Test head number|Site group number|Number (k) of test sites in site group|Array of test site numbers
    • Pmr:1|0|ADBIA0|11411|L18|1|1 Pin Map Record: PMR_INDX|CHAN_TYP|CHAN_TYP|PHY_NAM|LOG_NAM|HEAD_NUM|SITE_NUM
    • Dtr:AMD_Header_Start Datalog Text Record:
674 Dtr:AMD_Header_Start
  675 Dtr:Lot_ID: G0093579
  676 Dtr:Part_Number: 215-0869014-00
  677 Dtr:ERC_ID: N
  678 Dtr:Schedule_WO_ID: THT168.00
  679 Dtr:IN_QTY: 540
  680 Dtr:Production_Test: Y
  681 Dtr:Correlation: N
  682 Dtr:Eng_Screening: N
  683 Dtr:Retest: N
  684 Dtr:Retest_BIN: NA
  685 Dtr:Load_Board_ID: 2A-OLS3BGAC01
  686 Dtr:Tester_ID: 93KC15
  687 Dtr:Handler_ID: HGTC01
  688 Dtr:Temperature: 100
  689 Dtr:Remark: N
  690 Dtr:Test_House_ID: HTEST1
  691 Dtr:Platform: P
  692 Dtr:Hostname: suz93k15
  693 Dtr:Operator_ID: demo
  694 Dtr:Test_program: SAMOA_S3PRO_A0F1P_250revH
  695 Dtr:DateTime: 20160620044927
  696 Dtr:Software_REV: 7.1.4.6
  697 Dtr:Software_DATE: 20130205
  698 Dtr:CalDate: 20160516
  699 Dtr:HDCPServer1: 10.72.28.2
  700 Dtr:HDCPServer2: 10.72.28.3
  701 Dtr:Device_code: SAMOA_S3PRO
  702 Dtr:Test_Type: F
  703 Dtr:Test_Stage: 1
  704 Dtr:Soaking_Time: 0
  705 Dtr:AMD_OMI_REV_ID: 160
  706 Dtr:PH_driver_id: "General Handler Driver 5.2.0_test (local version /opt/93000/src/tci/handler/frame/src)" compiled at Tue Feb 5 11:07:39 CET
  707 Dtr:PH_plugin_id: "Seiko-Epson GPIB driver 5.2.0_test (local version /opt/93000/src/tci/handler/Seiko-Epson/func)" compiled at Tue Feb 5 10:4
  708 Dtr:PH_equipment_id: equipment_id_not_available
  709 Dtr:PH_family: handler_family: < F >                   "Seiko-Epson"
  710 Dtr:PH_model: model: < F >                            "NS6000"
  711 Dtr:PH_plugin: driver_plugin:                          "/opt/hp93000/soc/PH_libs/GenericHandler/Seiko-Epson/"
  712 Dtr:PH_config: configuration:                          "/opt/hp93000/soc/PH_libs/GenericHandler/Seiko-Epson/config/NS6000-GPIB-2.cfg"
  713 Dtr:AMD_Header_End
  714 Pir:1|1
  715 Pir:1|2
  716 Dtr:++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++
  717 Dtr:OMI Part Number  is(215-0869014-00)match load file Device Code Name(SAMOA_S3PRO)
  718 Dtr:++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++
  719 Dtr:++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++
  720 Dtr:OMI Part Number  is(215-0869014-00)match load file Device Code Name(SAMOA_S3PRO)
  721 Dtr:++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++
  722 Dtr:Device Code Name = SAMOA_S3PRO
  723 Dtr:Device Code Name = SAMOA_S3PRO
    • Ptr:2000000483|1|1|0|192|-0.198845997453|AllPin_BOTH_NEG_CONT:Continuity@PCIE_TX5N[1]||14|3|3|3|-1.0|-0.10000000149|V|%7.9f|%7.9f|%7.9f|0.0|0
      • Parametric Test Record:
    • Mpr:2000000594|1|1|0|0|19|19||0.0,0.0,0.0,0.0,0.0,0.0,0.0,0.0,0.0,0.0,0.0,0.0,0.0,0.0,0.0,0.0,0.0,0.0,0.0|EVDDQ_PS_Current_Monitor:DPS_Status
      • Multiple-Result Parametric Record:
    • Ftr:2000000602|1|1|0|247|0|0|1|0|0|0|0|0|0|||||[]|oland_A0_tst_reg_rw_anno_posttdo_plist|64,1,1||JTAG_TST_REG_NOM:Functional[1]||||255|[]
      • Functional Test Record: TEST_NUM|HEAD_NUM|SITE_NUM|TEST_FLG(fail, alarm, etc.)| OPT_FLAG|CYCL_CNT|REL_VADR|REPT_CNT|REPT_CNT|XFAIL_AD|yFAIL_AD|VECT_OFF|RTN_ICNT|…..
    • Gdr:240|0| EfuseCapt_Allbits_Zero EfuseCapt_Allbits_Zero PASS Generic Data Record: FLD_CNT|GEN_DATA
    • Dtr:LOT_ID =1402925076
2139 Dtr:LOT_ID                                              =1402925076
 2140 Dtr:WAFER_ID                                            =23
 2141 Dtr:WAFER_X                                             =30
 2366 Dtr:WS_WAFER_X                                    =30
 2370 Dtr:WAFER_Y                                             =14
 2380 Dtr:WS_WAFER_Y                                          =14
 2414 Dtr:WS_LOT_ID_WAFER_ID = 761549063
 2415 Dtr:WS_LOT_ID = THT168
 2416 Dtr:WS_WAFER_ID = 23
 2417 Dtr:WS_WAFER_X = 30
 2418 Dtr:WS_WAFER_Y = 14
 2419 Dtr:WS_CHECK_BIT = 0
 2420 Dtr:LOT_ID = THT168
 2421 Dtr:WAFER_ID = 23
 2422 Dtr:WAFER_X = 30
 2423 Dtr:WAFER_Y = 14
 2426 Gdr:240|0|    EfuseCapt_Allbits_Zero    EfuseCapt_Allbits_Zero    PASS
 2622 Dtr:<SerialEfuse read> Site = 2
          1. uid and sb result section.
3614 Dtr:Test_House_ID = HTEST1
 3615 Dtr:Unit ID = THT168233014
 3616 Dtr:SMS_Key = SMS_REPAIR_JPC0_ULSD_A000
 3617 Dtr:result_s0 = 100
 3618 Dtr:Test_House_ID = HTEST1
 3619 Dtr:Unit ID = THT168232215
 3620 Dtr:SMS_Key = SMS_REPAIR_JPC0_ULSD_A000
 3621 Dtr:result_s0 = 100
    • PRR(Part Result Record) and PIR(Part Information Record)
      • HEAD_NUM U*1 Test head number Head ID
      • SITE_NUM U*1 Test site number Site ID
      • PART_FLG B*1 Part information flag 
      • NUM_TEST U*2 Number of tests executed test#
      • HARD_BIN U*2 Hardware bin number HB HB
      • SOFT_BIN U*2 Software bin number 65535 SB
      • X_COORD I*2 (Wafer) X coordinate -32768
      • Y_COORD I*2 (Wafer) Y coordinate -32768
      • TEST_T U*4 Elapsed test time in milliseconds 0 test time with ms
      • PART_ID C*n Part identification length byte = 0
      • PART_TXT C*n Part description text length byte = 0 start test time
      • PART_FIX B*n Part repair information length byte = 0
6492 Prr:1|1|0|1634|1|1|-32768|-32768|11479|1|StartTime:20160620044929|[]
 6493 Prr:1|2|0|1634|1|1|-32768|-32768|11479|2|StartTime:20160620044929|[]
 6494 Pir:1|1
 6495 Pir:1|2
    • Final results for entire lot
      • Test Synopsis Record (TSR): used to identify test class failure count vs. test count and test time etc….

oHEAD_NUM U*1 Test head number See note oSITE_NUM U*1 Test site number oTEST_TYP C*1 Test type space oTEST_NUM U*4 Test number oEXEC_CNT U*4 Number of test executions 4,294,967,295 oFAIL_CNT U*4 Number of test failures 4,294,967,295 oALRM_CNT U*4 Number of alarmed tests 4,294,967,295 oTEST_NAM C*n Test name length byte = 0 oSEQ_NAME C*n Sequencer (program segment/flow) name length byte = 0 oTEST_LBL C*n Test label or text length byte = 0 oOPT_FLAG B*1 Optional data flag See note oTEST_TIM R*4 Average test execution time in seconds OPT_FLAG bit 2 = 1 oTEST_MIN R*4 Lowest test result value OPT_FLAG bit 0 = 1 oTEST_MAX R*4 Highest test result value OPT_FLAG bit 1 = 1 oTST_SUMS R*4 Sumof test result values OPT_FLAG bit 4 = 1 oTST_SQRS R*4 Sum of squares of test result values OPT_FLAG bit 5 = 1

360553 Tsr:1|1|P|2000000010|63|0|4294967295|POWER_SHORT_VSVM:PowerShort_VSVM@VDDC[1]|||200|0.0172914955765|0.100188463926|0.100311107934|6.312486648 56|0.0

      • HBR(Count of parts placed in each hardware bin), SBR(Count of parts assigned to each logical bin), PCR(Part count totals for lot), MRR(Global summary of results for entire lot)

367823 Hbr:1|1|1|60|P|GD1 Count of parts placed in each hardware bin, HEAD_NUM|SITE_NUM|COUNT|PorF flag|SB Description 367824 Hbr:1|2|1|52|P|GD1 367825 Hbr:255|0|1|112|P|GD1 HEAD_NUM = 255, the count is for all test sites 367826 Hbr:1|1|5|3|F|FUNC_SCAN_SMS_ANALOG_EFUSE_ULSD 367827 Hbr:1|2|5|10|F|FUNC_SCAN_SMS_ANALOG_EFUSE_ULSD 367828 Hbr:255|0|5|13|F|FUNC_SCAN_SMS_ANALOG_EFUSE_ULSD 367829 Sbr:1|1|1|60|P|GD1 367830 Sbr:1|2|1|52|P|GD1 367831 Sbr:255|0|1|112|P|GD1 367832 Sbr:1|1|92|2|F|FUSE_Read 367833 Sbr:1|2|92|10|F|FUSE_Read 367834 Sbr:255|0|92|12|F|FUSE_Read 367835 Sbr:1|1|458|1|F|Defect_Grp1 367836 Sbr:255|0|458|1|F|Defect_Grp1 367837 Pcr:1|1|63|0|4294967295|60|4294967295 367838 Pcr:1|2|62|0|4294967295|52|4294967295 367839 Pcr:255|0|125|0|4294967295|112|4294967295 367840 Mrr:13:07:10 20-Jun-2016| ||

end...

UID rule

  • some multi-site testers data file (stdf or kdf) will has only single uid in a touch down but Prr or Unit field will record both, that is same as UBS KDF file, so I will to generate a false UID for another one and align with AMD's practice.
  • UID generate rule: LOTID+TESTERID+UNITDATE+SITEID+UNITSEQ
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